Article

Strides in Atomic Force Microscope Design.Posted by Sudhir

Atomic force microscopes may have a big impact on the medical and semiconductor fields in the future but for that to happen, speed will likely have to be less of an issue. Kamal Yousef-Toumi, a professor of mechanical engineering at MIT, says his team has been making strides in this area.

“Basically, atomic force resolution systems, meaning resolutions down to the atomic level, have been worked on for maybe almost 25 years,” he explains. “We started with funding from Samsung and they do semiconductor manufacturing. Wafers needed to be looked at and inspected so the company wanted an instrument that could look at them in a very fast way because existing commercial instruments didn’t have the speed. That was one of the reasons for designing and making these microscopes, to have high-speed imaging.”

The result was his team’s atomic force microscope, which can scan images 2,000 times faster than existing commercial models.

Read More

Hide Me

10

Top Article

May 25, 2016

Investigation of compressive properties of 3D fiber reinfor ...

Apr 08, 2016

Six core activities in the commissioning of the earthing sy ...

Apr 08, 2016

What Is The Energy, But For Real?

Apr 08, 2016

Strides in Atomic Force Microscope Design.

Apr 08, 2016

Anaerobic Digesters Reduce Fossil-Fuel Dependence

Apr 08, 2016

New institute will accelerate innovations in fibers and fab ...

Apr 08, 2016

Scientists store digital images in DNA, and retrieves them ...

Apr 08, 2016

India aims to capture 20% market share in IoT: Nasscom

Apr 08, 2016

IT to get Rs 600 crore more in UID project

Events

August 15,2015

Lorem ipsum dolor sit amet, consectetur adipiscing elit.

July 08,2015

Nullam non turpis sit amet metus tristique egestas et et orci.

February 15,2015

Duis venenatis ac ipsum vel ultricies in placerat quam

January 15,2015

Pellentesque ullamcorper fringilla ipsum, ornare dapibus velit volutpat sit amet.

September 24,2014

In lobortis ipsum mi, ac imperdiet elit pellentesque at.